• DocumentCode
    3548100
  • Title

    Fast PLL simulation using nonlinear VCO macromodels for accurate prediction of jitter and cycle-slipping due to loop nonidealities and supply noise

  • Author

    Lai, Xiaolue ; Wan, Yayun ; Roychowdhury, Jaijeet

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    1
  • fYear
    2005
  • fDate
    18-21 Jan. 2005
  • Firstpage
    459
  • Abstract
    Phase-locked loops (PLLs) are widely used in electronic systems. As PLL malfunction is one of the most important factors in re-fabs of SoCs, fast simulation of PLLs to capture non-ideal behavior accurately is an immediate, pressing need in the semiconductor design industry. In this paper, we present a nonlinear macro model based PLL simulation technique that is considerably more accurate than prior linear PLL simulation techniques. Our method is able to accurately capture transient behavior and faithfully estimate timing jitter in noisy PLLs. We demonstrate the proposed technique on ring and LC voltage-controlled oscillator (VCO) based PLLs, and compare results against linear PLL macromodels and full SPICE-level simulation. We show that, unlike prior linear macromodel based approaches, the proposed nonlinear technique captures the dynamics of complex phenomena such as locking, cycle slipping and power supply noise induced PLL jitter, replicating qualitative features from full SPICE simulations accurately while providing speedups of over two orders of magnitude.
  • Keywords
    SPICE; circuit simulation; integrated circuit modelling; integrated circuit noise; phase locked loops; timing jitter; voltage-controlled oscillators; LC voltage-controlled oscillator; PLL simulation; SPICE-level simulation; cycle slipping; loop nonidealities; nonlinear VCO macromodels; nonlinear macro model; phase-locked loops; power supply noise; semiconductor design industry; timing jitter; transient behavior; Circuit simulation; Clocks; Filters; Frequency; Jitter; Phase locked loops; Predictive models; SPICE; Semiconductor device noise; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
  • Print_ISBN
    0-7803-8736-8
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2005.1466207
  • Filename
    1466207