DocumentCode :
3548377
Title :
Sleep transistor sizing using timing criticality and temporal currents
Author :
Ramalingam, Anand ; Zhang, Bin ; Pan, David Z. ; Devgan, Anirudh
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Volume :
2
fYear :
2005
fDate :
21-21 Jan. 2005
Firstpage :
1094
Abstract :
Power gating is a circuit technique that enables high performance and low power operation. One of the challenges in power gating is sizing the sleep transistor which is used to gate the power supply. This paper presents a new methodology based on timing criticality and temporal currents to size the sleep transistor. The timing criticality information and temporal current estimation are obtained using static timing analyzer. The results obtained indicate that our proposed technique results in area reduction of sleep transistors by 80% and 49% compared to module based design and cluster based design respectively.
Keywords :
MOSFET; power supply circuits; area reduction; high performance operation; low power operation; power gating; sleep transistor sizing; static timing analyzer; temporal currents; timing criticality; High performance computing; Power engineering and energy; Power engineering computing; Power supplies; Resistors; Switching circuits; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Conference_Location :
Shanghai
Print_ISBN :
0-7803-8736-8
Type :
conf
DOI :
10.1109/ASPDAC.2005.1466531
Filename :
1466531
Link To Document :
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