Title :
Bridging, transition, and stuck-open faults in self-testing CMOS checkers
Author :
Millman, S.D. ; McCluskey, E.J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
Abstract :
The consequences of bridging, transition, and stuck-open faults in self-testing checkers designed only for single stuck-at faults are examined. A methodology for design that guarantees that the checkers will be self-testing in the presence of bridging, transition and stuck-open faults is established. This methodology is applied to several implementations of self-testing checkers. Simulations confirm that these checkers are self-testing in the presence of bridging, transition, and stuck-open faults. The problems associated with testing the checkers in the presence of non-stuck-at faults and the problems that result from reducing the number of checker outputs from two to one are discussed. It is shown that self-testing checkers designed for stuck-at faults will remain self-testing in the presence of nonclassical faults.<>
Keywords :
CMOS integrated circuits; automatic testing; fault location; integrated circuit testing; logic testing; bridging; self-testing CMOS checkers; simulations; stuck-at faults; stuck-open faults; transition; Automatic testing; Built-in self-test; CMOS technology; Circuit faults; Computer errors; Design methodology; Electrical fault detection; Fault detection; Laboratories; Runtime;
Conference_Titel :
Fault-Tolerant Computing, 1991. FTCS-21. Digest of Papers., Twenty-First International Symposium
Conference_Location :
Montreal, Quebec, Canada
Print_ISBN :
0-8186-2150-8
DOI :
10.1109/FTCS.1991.146655
