Title :
Multiple fault analysis using a fault dropping technique
Author :
Verreault, A. ; Aboulhamid, E.M. ; Karkouri, Y.
Author_Institution :
Dept. d´´Inf. et de Recherche Oper., Montreal Univ., Que., Canada
Abstract :
A method for analyzing multiple faults in gate-level combinational circuits that does not explicitly enumerate all the multiple stuck-at faults that may be present in a circuit is presented. First, a fault collapsing phase is applied to the network, so that equivalent faults are eliminated. During the analysis, frontier faults where there is at least a normal path from each faulty line to a primary output are considered. It is shown that the set of frontier faults is equivalent to the set of multiple faults. Given an input vector, the normal circuit is evaluated and the fault effects propagated. A fault dropping procedure is then applied to eliminate faulty conditions on specific lines that are either absent or permanently masked by other faulty conditions. The method is applied to some benchmark circuits, and significant speedup is observed.<>
Keywords :
combinatorial circuits; fault location; logic testing; benchmark circuits; equivalent faults; fault collapsing phase; fault dropping technique; frontier faults; gate-level combinational circuits; multiple fault analysis; multiple stuck-at faults; Automatic test pattern generation; Circuit faults; Circuit simulation; Electrical fault detection; Fault detection; Logic circuits; Microelectronics; Performance analysis; Very large scale integration; Workstations;
Conference_Titel :
Fault-Tolerant Computing, 1991. FTCS-21. Digest of Papers., Twenty-First International Symposium
Conference_Location :
Montreal, Quebec, Canada
Print_ISBN :
0-8186-2150-8
DOI :
10.1109/FTCS.1991.146656