DocumentCode :
3548435
Title :
Using loop invariants to fight soft errors in data caches
Author :
Krishna, N. Sri Hari ; Son, Seung Woo ; Kandemir, Mahmut ; Li, Feihui
Author_Institution :
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., USA
Volume :
2
fYear :
2005
fDate :
18-21 Jan. 2005
Firstpage :
1317
Abstract :
Ever scaling process technology makes embedded systems more vulnerable to soft errors than in the past. One of the generic methods used to fight soft errors is based on duplicating instructions either in the spatial or temporal domain and then comparing the results to see whether they are different. This full duplication based scheme, though effective, is very expensive in terms of performance, power, and memory space. In this paper, we propose an alternate scheme based on loop invariants and present experimental results which show that our approach catches 62% of the errors caught by full duplication, when averaged over all benchmarks tested. In addition, it reduces the execution cycles and memory demand of the full duplication strategy by 80% and 4%, respectively.
Keywords :
cache storage; electronic engineering computing; embedded systems; error detection; fault diagnosis; integrated circuit reliability; logic testing; program compilers; software fault tolerance; data caches; embedded systems; full duplication based scheme; loop invariants; scaling process technology; soft errors; Benchmark testing; Computer errors; Computer science; Embedded system; Error correction; Hardware; Logic devices; Semiconductor devices; Software measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Print_ISBN :
0-7803-8736-8
Type :
conf
DOI :
10.1109/ASPDAC.2005.1466586
Filename :
1466586
Link To Document :
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