Title :
Volume reflection gratings in photorefractive quantum well thin films
Author :
Nolte, David D. ; Lahiri, I. ; Melloch, M.R.
Author_Institution :
Dept. of Phys., Purdue Univ., West Lafayette, IN, USA
Abstract :
Summary form only given. We present the first, to our knowledge, experimental demonstration of the remaining photorefractive quantum well geometry; the longitudinal reflection geometry, operating with counter-propagating pump beams that generate reflection gratings within the quantum well structure. Two-wave mixing experiments were performed to verify the presence of space-charge volume gratings within the semiconductor device. The quantum well structures in our study consisted of 35 /spl Aring/ AlAs or Al/sub 0.5/Ga/sub 0.5/As barriers and 100 /spl Aring/ GaAs quantum wells.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; holographic gratings; light reflection; multiwave mixing; photorefractive materials; semiconductor quantum wells; space charge; Al/sub 0.5/Ga/sub 0.5/As; Al/sub 0.5/Ga/sub 0.5/As barriers; AlAs barriers; AlAs-GaAs; AlGaAs-GaAs; GaAs quantum wells; counter-propagating pump beams; longitudinal reflection geometry; photorefractive quantum well geometry; photorefractive quantum well thin films; reflection gratings; semiconductor device; space-charge volume gratings; two-wave mixing; volume reflection gratings; Absorption; Gallium arsenide; Geometry; Gratings; Molecular beam epitaxial growth; Optical reflection; Photorefractive effect; Physics; Substrates; Transistors;
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2
