Title :
Test results of a CdZnTe pixel detector read out by RENA-2 IC
Author :
Tümer, Tümay O. ; Cajipe, Victoria B. ; Clajus, Martin ; Duttweiler, Fred ; Hayakawa, Satoshi ; Matteson, James L. ; Shirley, Arnie ; Yossifor, Oded
Author_Institution :
NOVA R&D Inc., Riverside, CA
Abstract :
A new mixed signal integrated circuit (IC) for front-end readout electronics of position sensitive solid state detectors has been developed. It is called RENA-2 and can be used for readout of position sensitive solid state detectors such as CdTe, CdZnTe, Ge, GaAs, HgI2, PbI2, Se and Si strip, pad and pixel detectors, with large numbers of channels. It is designed to have very low noise and, therefore, high energy resolution. It has numerous possible applications in astrophysics, medical and industrial imaging, security such as baggage inspection and nuclear physics. The RENA-2 chip is a monolithic integrated circuit and has 36 channels with low noise, high input impedance charge sensitive amplifiers. The RENA-2 chip can be optimized for individual applications
Keywords :
X-ray detection; gamma-ray detection; germanium radiation detectors; monolithic integrated circuits; position sensitive particle detectors; readout electronics; semiconductor counters; silicon radiation detectors; CdTe detectors; CdZnTe pixel detector; GaAs detectors; Ge detectors; HgI2 detectors; PbI2 detectors; RENA-2 IC; Se strip detectors; Si strip detectors; astrophysics; baggage inspection; front-end readout electronics; high energy resolution; high input impedance charge sensitive amplifiers; industrial imaging; medical imaging; monolithic integrated circuit; nuclear physics; pad detectors; pixel detectors; position sensitive solid state detectors; Circuit testing; Electronic equipment testing; Gallium arsenide; Integrated circuit noise; Integrated circuit testing; Mixed analog digital integrated circuits; Position sensitive particle detectors; Readout electronics; Solid state circuits; Strips;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Conference_Location :
Rome
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1466854