Title :
XPAD : pixel detector for material sciences
Author :
Basolo, S. ; Bérar, J.F. ; Boudet, N. ; Breugnon, P. ; Caillot, B. ; Clemens, J.C. ; Delpierre, P. ; Dinkespiler, B. ; Koudobine, I. ; Meessen, Ch. ; Menouni, M. ; Mouget, Ch ; Pangaud, P. ; Potheau, R. ; Vigeolas, E.
Author_Institution :
CPPM-IN2P3, Marseille
Abstract :
Currently available 2D detectors do not make full use of the high flux and high brilliance of third generation synchrotron sources. XPAD prototype, using active pixels, has been developped to fullfill the needs of materials science scattering experiments. At the time, its prototype is build of 8 modules of 8 chips. The threshold calibration of ap 4times104 pixels is discussed. Applications to powder diffraction or SAXS experiments proof that it allows to record high quality data
Keywords :
X-ray detection; nuclear electronics; position sensitive particle detectors; semiconductor counters; SAXS experiments; XPAD photon counting detector; electronic characteristics; materials science scattering experiments; pixel detector; powder diffraction; prototype; third generation synchrotron sources; CMOS technology; Detectors; Diffraction; Electromagnetic scattering; Electrons; Materials science and technology; Optoelectronic and photonic sensors; Particle scattering; Prototypes; Synchrotrons;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Conference_Location :
Rome
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1466858
