Complete characterization of femtosecond pulses with all-electronic detection

Summary form only given. Most current techniques for the determination of the characteristics of subpicosecond laser pulses involve an optical nonlinearity with a femtosecond response time. Unfortunately, broadband nonlinearities are generally weak and require intense ultrashort pulses. There exists a need for an electronic device that could cover a broad range of wavelengths. In this work, we extend the attainable temporal resolution with this same device to the femtosecond regime, using it in a frequency-domain measurement, which measures the first derivative of the spectral phase via a cross correlation of the pulse and spectrally filtered slices of the same pulse.. To our knowledge, this is the first direct measurement of the amplitude and phase of a femtosecond pulse employing only an integrated optoelectronic circuit. A Ti:sapphire laser operating near 800 nm was used as a source of pulses.