DocumentCode :
3548613
Title :
Evaluation of pixellated HgI/sub 2/ detectors
Author :
Hitomi, Keitaro ; Meng, Ling Jian ; He, Zhong
Author_Institution :
Dept. of Electron., Tohoku Inst. of Technol., Sendai
Volume :
7
fYear :
2004
fDate :
16-22 Oct. 2004
Firstpage :
4456
Lastpage :
4460
Abstract :
Pixellated mercuric iodide (HgI2) detectors with thickness of 5 and 10 mm have been investigated using depth sensing single polarity charge sensing technique at room temperatures. By acquiring energy spectra of 137Cs as a function of the interaction depth, an insensitive region exhibiting poor spectroscopic performance was observed in the vicinity of the cathode surface of a 10 mm thick HgI2 detector operated at 2500 V, while the other regions of the detector present clear photo peaks with good energy resolutions. The thickness of the insensitive region is estimated to be around 2 mm. The electron mobility-lifetime (mutau) product was estimated based on the change of photopeak amplitude at different bias voltages. The value of electron mutau product was estimated to be around 1.9times10-3 cm2/V which is smaller than the value of 7.4times10-3 cm2/V reported earlier
Keywords :
electron mobility; semiconductor counters; 10 mm; 293 to 298 K; 5 mm; 137Cs; cathode surface; depth sensing single polarity charge sensing technique; electron mobility-lifetime; mercuric iodide; pixellated HgI2 detectors; Anodes; Cathodes; Electrodes; Energy resolution; Gamma ray detectors; Photonic band gap; Preamplifiers; Semiconductor materials; Spectroscopy; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Conference_Location :
Rome
ISSN :
1082-3654
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
Type :
conf
DOI :
10.1109/NSSMIC.2004.1466874
Filename :
1466874
Link To Document :
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