DocumentCode
3548613
Title
Evaluation of pixellated HgI/sub 2/ detectors
Author
Hitomi, Keitaro ; Meng, Ling Jian ; He, Zhong
Author_Institution
Dept. of Electron., Tohoku Inst. of Technol., Sendai
Volume
7
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
4456
Lastpage
4460
Abstract
Pixellated mercuric iodide (HgI2) detectors with thickness of 5 and 10 mm have been investigated using depth sensing single polarity charge sensing technique at room temperatures. By acquiring energy spectra of 137Cs as a function of the interaction depth, an insensitive region exhibiting poor spectroscopic performance was observed in the vicinity of the cathode surface of a 10 mm thick HgI2 detector operated at 2500 V, while the other regions of the detector present clear photo peaks with good energy resolutions. The thickness of the insensitive region is estimated to be around 2 mm. The electron mobility-lifetime (mutau) product was estimated based on the change of photopeak amplitude at different bias voltages. The value of electron mutau product was estimated to be around 1.9times10-3 cm2/V which is smaller than the value of 7.4times10-3 cm2/V reported earlier
Keywords
electron mobility; semiconductor counters; 10 mm; 293 to 298 K; 5 mm; 137Cs; cathode surface; depth sensing single polarity charge sensing technique; electron mobility-lifetime; mercuric iodide; pixellated HgI2 detectors; Anodes; Cathodes; Electrodes; Energy resolution; Gamma ray detectors; Photonic band gap; Preamplifiers; Semiconductor materials; Spectroscopy; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
Conference_Location
Rome
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1466874
Filename
1466874
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