DocumentCode
3548624
Title
Synthesis and luminescence characterization of fine gadolinium oxide phosphors for high resolution X-ray imaging
Author
Kang, Snag-Sik ; Park, Ji-Koon ; Chang, Gi-Won ; Cha, Byung-Youl ; Shin, Jung-wook ; Nam, Sang-hee ; Mun, Chi-Woong
Author_Institution
Med. Imaging Res. Center, Inje Univ., Kyungnahm, South Korea
Volume
7
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
4510
Abstract
In this work, fine Gd2O3:Eu powder was synthesized using a solution-combustion method for high-resolution digital X-ray imaging detectors. The structure of the phosphors was characterized by X-ray diffraction (XRD), high-resolution scanning electron microscopy (HR-SEM). It was possible to obtain fine Gd2O3:Eu crystallized particles with an average particle size of only 20 nm. The optical properties investigated were photoluminescence emission and excitation spectra, luminescence decay time, and X-ray conversion efficiency. The emission corresponding to the 5D0→7F2 transition at 610 nm was dominant, and the Eu3+ ions substituted well for the Gd3+ sites. Quenching starts at an europium concentration of 8% wt, and the strongest X-ray conversion efficiency was achieved at the phosphor with 5% wt. The mean lifetime of synthesized phosphors is 2.3-2.6 ms.
Keywords
X-ray detection; X-ray diffraction; X-ray imaging; combustion synthesis; europium; gadolinium compounds; particle size; phosphors; photoluminescence; powder technology; scanning electron microscopy; 610 nm; 5D0 to 7F2 transition; Eu3+ ions; Gd2O3:Eu; Gd3+; HR-SEM; X-ray conversion efficiency; X-ray diffraction; XRD; crystallized particles; europium concentration; excitation spectra; fine gadolinium oxide phosphor powder; high-resolution digital X-ray imaging detectors; high-resolution scanning electron microscopy; luminescence decay time; optical properties; particle size; photoluminescence emission; quenching; solution-combustion method; synthesized phosphor mean lifetime; Image resolution; Luminescence; Optical diffraction; Phosphors; Powders; X-ray detection; X-ray detectors; X-ray diffraction; X-ray imaging; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1466885
Filename
1466885
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