Title :
Dynamic Adhesive Instability of Sub-Five Nanometer Head-Disk Interfaces
Author :
Suh, Allison Y. ; Polycarpou, Andreas A.
Author_Institution :
Dept. of Mech. & Ind. Eng., Illinois Univ., Urbana, IL
Abstract :
Understanding of dynamic adhesive, contact and friction interactions and associated instabilities at magnetic storage head-disk interfaces (HDIs) is critical as the physical distance between the recording slider and the high-speed rotating disk decreases to sub-five nanometers to achieve 155 Gbit/cm2 (1 Tbit/in2) recording densities. In this study, a two degree-of-freedom nonlinear dynamic model that includes realistic roughness, adhesion, friction and the dynamics of a flying and contacting HDI was developed to characterize a fully flying (6.8 nm) and a pseudo-contacting (3 nm) HDI utilizing different air-bearing designs. The effect of roughness on the slider flying performance and stability was also investigated through a comparison to a simple two flat parallel surface counterpart. The simulation results revealed that while adhesion has little influence in a fully flying interface when flying heights are above 5 nm, it leads to prolonged contact, higher bouncing vibrations and unstable slider behavior for 3 nm flying height. At such low nominal flying height, the inclusion of the electrostatic force also exacerbates HDI unstable behavior
Keywords :
adhesives; friction; mechanical contact; nanotechnology; 3 nm; 6.8 nm; air-bearing designs; bouncing vibrations; dynamic adhesive instability; electrostatic force; friction interactions; magnetic storage head-disk interfaces; nonlinear dynamic model; pseudo-contacting; subfive nanometer head-disk interfaces; Adhesives; Disk recording; Friction; Magnetic heads; Magnetic memory; Magnetic recording; Predictive models; Rough surfaces; Surface roughness; Vibrations;
Conference_Titel :
Intelligent Control, 2005. Proceedings of the 2005 IEEE International Symposium on, Mediterrean Conference on Control and Automation
Conference_Location :
Limassol
Print_ISBN :
0-7803-8936-0
DOI :
10.1109/.2005.1467005