DocumentCode :
3549144
Title :
Learning feature distance measures for image correspondences
Author :
Chen, Xi ; Cham, Tat-Jen
Author_Institution :
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore
Volume :
2
fYear :
2005
fDate :
20-25 June 2005
Firstpage :
560
Abstract :
Standard but ad hoc measures such as sum-of-squared pixel differences (SSD) are often used when comparing and registering two images that have not been previously observed before. In this paper, we propose a framework to address the problem of learning a parametric feature distance measure to measure the dissimilarity between pairs of images. The method is based on optimizing the parameters of the distance measure in order to minimize correspondence classification errors on training data. Because the learning process involves relative (rather than absolute) visual content between image pairs, the learned distance measure may also be applied to other images with very different visual content. Results on matching classification with a wide variety of image content show that the learned feature distance measure clearly outperforms the standard measures of SSD, chamfer and Bhattacharyya histogram distances.
Keywords :
feature extraction; image classification; image matching; image recognition; image registration; learning (artificial intelligence); Bhattacharyya histogram distance; feature distance measures; image classification; image dissimilarity; image matching; image registration; learning (artificial intelligence); sum-of-squared pixel differences; Content based retrieval; Histograms; Image matching; Image retrieval; Measurement standards; Object detection; Optimization methods; Pixel; Testing; Training data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2005. CVPR 2005. IEEE Computer Society Conference on
ISSN :
1063-6919
Print_ISBN :
0-7695-2372-2
Type :
conf
DOI :
10.1109/CVPR.2005.205
Filename :
1467491
Link To Document :
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