Title :
Characterization of domain-inverted structures in quasi-phase-matched devices by the SHG microscope
Author :
Kurimura, Sunao ; Uesu, Y.
Author_Institution :
Dept. of Phys., Waseda Univ., Tokyo, Japan
Abstract :
Summary form only given. Although the domain structure is a key component in the devices, destructive etching has been a main technique for observing domains. We have recently constructed a second-harmonic-generation microscope (SHGM) and applied it to the nondestructive domain characterization. We report here new application to a Z cut QPM device with different crystal orientation and evaluation of the periodicity using Fourier transformation of SH pictures.
Keywords :
Fourier transform optics; domains; etching; optical harmonic generation; optical microscopy; Fourier transformation; SH pictures; SHG microscope; Z cut QPM device; crystal orientation; destructive etching; domain-inverted structures; nondestructive domain characterization; periodicity; quasi-phase-matched devices; second-harmonic-generation microscope; Birefringence; Frequency; Laser excitation; Microscopy; Nonlinear optics; Optical devices; Optical harmonic generation; Optical pumping; Pulsed power supplies; Pump lasers;
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2
