Title :
Formal semantics and verification for feature modeling
Author :
Sun, Jing ; Zhang, Hongyu ; Yuan Fang ; Wang, Hai
Author_Institution :
Dept. of Comput. Sci., Auckland Univ., New Zealand
Abstract :
Research on features has received much attention in the domain engineering community. Feature modeling plays an important role in the design and implementation of complex software systems. However, the presentation and analysis of feature models are still largely informal. There is also an increasing need for methods and tools that can support automated feature model analysis. This paper presents a formal engineering approach to the specification and verification of feature models. A formal semantics for the feature modeling language is defined using first-order logic. It provides a precise and rigorous formal interpretation for the graphical notation. In addition, further validation of the semantics using the Z/EVES theorem prover is presented. Finally, we demonstrate that the consistency of a feature model and its configurations can be automatically verified by encoding the semantics into the Alloy Analyzer. A case study of the Key Word in Context (KWIC) index systems feature model is presented to illustrate the verification process.
Keywords :
formal logic; formal specification; formal verification; programming language semantics; theorem proving; Alloy Analyzer; KWIC index system; Key Word in Context; Z/EVES theorem prover; domain engineering; feature model analysis; feature oriented domain analysis; first-order logic; formal engineering; formal semantics; formal specification; formal verification; graphical notation; semantics encoding; software design; software systems; Application software; Computer science; Context modeling; Encoding; Formal verification; Information technology; Logic; Software systems; Sun; Tree graphs; Alloy; Domain Engineering; Feature Modeling; Feature Oriented Domain Analysis; Formal Verification; Z/EVES;
Conference_Titel :
Engineering of Complex Computer Systems, 2005. ICECCS 2005. Proceedings. 10th IEEE International Conference on
Print_ISBN :
0-7695-2284-X
DOI :
10.1109/ICECCS.2005.48