Rapid diagnostics of an ASIC IP block using dynamic laser scanning

Author

Liao, Joy Y. ; Chen, Xiaoding ; Marks, Howard Lee ; Nishizaki, Craig ; Woods, Gary L. ; Vedagarbha, Praveen ; Nataraj, Nagamani

Author_Institution

NVIDIA Corp., Santa Clara, CA, USA

fYear

2005

fDate

27 June-1 July 2005

Firstpage

27

Lastpage

31

Abstract

Recently a powerful class of failure analysis techniques based on dynamic laser stimulation (DLS) of operating ICs has been developed. DLS techniques include soft-defect localization (SDL), in which a 1.3μm laser locally heats the device, and laser-assisted device alteration (LADA), in which a 1.06 μm laser injects photocurrent. In this paper we report the use of DLS to locate a marginal circuit in an IP memory block on an advanced graphics ASIC with 0.11 μm technology.

Keywords

application specific integrated circuits; failure analysis; fault diagnosis; integrated circuit testing; laser beam applications; photoconductivity; 0.11 micron; 1.06 micron; 1.3 micron; ASIC IP block; IP memory; advanced graphics ASIC; application specific integrated circuits; dynamic laser scanning; failure analysis; laser-assisted device alteration; marginal circuit; photocurrent; rapid diagnostics; soft-defect localization; Application specific integrated circuits; Automatic testing; Clocks; Failure analysis; Power lasers; Power supplies; Random access memory; Temperature sensors; Timing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Proceedings of the 12th International Symposium on the

Print_ISBN

0-7803-9301-5

Type

conf

DOI

10.1109/IPFA.2005.1469125

Filename

1469125