Moire stabilized thermal imaging

A new method of backside thermal mapping based on the relationship between mechanical strain and local interference pattern shifts will be shown for the first time. Sensitivity will be shown to be far superior to IR camera imaging methods and comparable to fluorescence microthermal imaging (FMI), allowing entire array blocks with low power consumption to be identified. This new method of acquisition controls synchronously the thermal propagation, while building up the thermal signal to enhance the Moire pattern sensitivity.