Title :
A low leakage SRAM macro with replica cell biasing scheme
Author :
Takeyama, Y. ; Otake, H. ; Hirabayashi, O. ; Kushida, K. ; Otsuka, N.
Author_Institution :
Semicond. Co., Toshiba Corp., Kawasaki, Japan
Abstract :
The growth of mobile equipment market is spurring demand for low-power SRAM macros. For mobile applications, in particular, there is a need to reduce standby current leakage while keeping memory cell data. For this purpose, several techniques have been reported. They introduce reduction of cell bias voltage in standby state, but the cell bias level is determined by Vth and supply voltage as described later. In 90nm technology and beyond, fluctuation of Vth is increasing and leakage reduction efficiency of these techniques is greatly affected. Therefore, a cell leakage reduction technique immune to process and/or environment fluctuations is required. In addition, leakage reduction in row decoder circuit is also desirable, because standby current leakage in peripheral circuits is dominated by row decoders. In order to meet these requirements, a novel cell bias control technique and a novel row decoder circuit are proposed. We fabricated a 90nm 512Kb low leakage SRAM macro.
Keywords :
SRAM chips; cellular arrays; leakage currents; low-power electronics; mobile handsets; power supplies to apparatus; 512 Kbit; 90 nm; Vth fluctuation; cell bias control technique; cell bias voltage; low leakage SRAM macro; low-power SRAM macro; memory cell data; mobile application; mobile equipment market; replica cell biasing scheme; row decoder circuit; standby current leakage reduction; Circuits; Clamps; Decoding; Diodes; Fluctuations; MOS devices; Random access memory; Substrates; Switches; Voltage;
Conference_Titel :
VLSI Circuits, 2005. Digest of Technical Papers. 2005 Symposium on
Print_ISBN :
4-900784-01-X
DOI :
10.1109/VLSIC.2005.1469357