• DocumentCode
    3549962
  • Title

    Bitline leakage compensation (BLC) and leakage reduction (BLR) techniques for 2-3GHz on-chip cache arrays in microprocessors on 90nm logic technology

  • Author

    Khellah, Muhammad ; Ye, Yibin ; Somasekhar, Dinesh ; Casper, Derek ; Bloechel, Bradley ; Nguyen, Trang ; Dermer, Greg ; Zhang, Kevin ; Pandya, Gunjan ; Farhang, Ali ; De, Vivek

  • Author_Institution
    Circuits Res., Intel, Hillsboro, OR, USA
  • fYear
    2005
  • fDate
    16-18 June 2005
  • Firstpage
    262
  • Lastpage
    263
  • Abstract
    Bitline leakage compensation (BLC) and leakage reduction (BLR) techniques, implemented for cache arrays on a testchip in a 90nm logic technology, demonstrate improvement in operational frequency from 1.2GHz to 2GHz for BLC, and to 3GHz for BLR, with 17% and 10% area impacts, respectively.
  • Keywords
    cache storage; integrated circuit measurement; logic testing; microprocessor chips; 1.2 to 3 GHz; 90 nm; bitline leakage compensation; bitline leakage reduction; logic technology; microprocessors; on chip cache arrays; Calibration; Circuit testing; Delay; Frequency; Logic arrays; Logic circuits; Logic design; Logic testing; Microprocessors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2005. Digest of Technical Papers. 2005 Symposium on
  • Print_ISBN
    4-900784-01-X
  • Type

    conf

  • DOI
    10.1109/VLSIC.2005.1469381
  • Filename
    1469381