DocumentCode
3549988
Title
A 0.4-V high-speed, long-retention-time DRAM array with 12-F2 twin cell
Author
Takemura, Riichiro ; Itoh, Kiyoo ; Sekiguchi, Tomonori ; Akiyama, Satoru ; Hanzawa, Satoru ; Kajigaya, Kazuhiko ; Kawahara, Takayuki
Author_Institution
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fYear
2005
fDate
16-18 June 2005
Firstpage
362
Lastpage
365
Abstract
We propose and evaluate a DRAM cell array with 12-F2 twin cell in terms of speed, retention time, and low-voltage operation. The write time and retention time of the twin-cell array become shorter by 50% and longer by more than 20% than those of a single cell array, enabling a 0.4-V operation. Furthermore, the cell accepts the plate-driven scheme without dummy cell, lowering the necessary word-line voltage by 0.4 V.
Keywords
DRAM chips; cellular arrays; integrated circuit design; low-power electronics; 0.4 V; 12-F2 twin cell; dummy cell; low voltage RAM; plate-driven cell; retention time; twin-cell DRAM array; word line voltage; write time; Capacitance measurement; Circuits; Noise figure; P-n junctions; Random access memory; Tellurium; Time measurement; Very large scale integration; Virtual colonoscopy; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 2005. Digest of Technical Papers. 2005 Symposium on
Print_ISBN
4-900784-01-X
Type
conf
DOI
10.1109/VLSIC.2005.1469405
Filename
1469405
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