DocumentCode
355008
Title
Application of optical coherence tomography in nondestructive evaluation of material microstructure
Author
Swanson, E.A. ; Hee, M.R. ; Tearney, G.J. ; Fujimoto, J.G.
Author_Institution
Lincoln Lab., MIT, Lexington, MA, USA
fYear
1996
fDate
2-7 June 1996
Firstpage
326
Lastpage
327
Abstract
Summary form only given. Techniques for nondestructive evaluation (NDE), testing, and inspection of parts during manufacturing and materials processing, in situ, or during design, is a key technology. The authors use optical coherence tomography (OCT) is a high-resolution, high-sensitivity imaging technology that is based on the coherence properties of light.
Keywords
inspection; light coherence; nondestructive testing; optical images; optical resolving power; optical tomography; sensitivity; NDE; coherence properties; high-resolution; high-sensitivity imaging technology; in situ; inspection; material microstructure; materials processing; nondestructive evaluation; optical coherence tomography; High-resolution imaging; Inspection; Manufacturing processes; Materials processing; Materials testing; Microstructure; Nondestructive testing; Optical imaging; Optical materials; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location
Anaheim, CA, USA
Print_ISBN
1-55752-443-2
Type
conf
Filename
864744
Link To Document