Title :
Application of optical coherence tomography in nondestructive evaluation of material microstructure
Author :
Swanson, E.A. ; Hee, M.R. ; Tearney, G.J. ; Fujimoto, J.G.
Author_Institution :
Lincoln Lab., MIT, Lexington, MA, USA
Abstract :
Summary form only given. Techniques for nondestructive evaluation (NDE), testing, and inspection of parts during manufacturing and materials processing, in situ, or during design, is a key technology. The authors use optical coherence tomography (OCT) is a high-resolution, high-sensitivity imaging technology that is based on the coherence properties of light.
Keywords :
inspection; light coherence; nondestructive testing; optical images; optical resolving power; optical tomography; sensitivity; NDE; coherence properties; high-resolution; high-sensitivity imaging technology; in situ; inspection; material microstructure; materials processing; nondestructive evaluation; optical coherence tomography; High-resolution imaging; Inspection; Manufacturing processes; Materials processing; Materials testing; Microstructure; Nondestructive testing; Optical imaging; Optical materials; Tomography;
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2
