Title :
Subsurface defect detection in ceramic materials using an optical gated scatter reflectometer
Author :
Bashkansky, M. ; Duncan, M.D. ; Kahn, M. ; Reintjes, J. ; Battle, Phillip R.
Author_Institution :
Laser Phys. Branch, Naval Res. Lab., Washington, DC, USA
Abstract :
Summary form only given. We have developed an instrument that is capable of seeing into the subsurface region of most ceramic materials. It is based on optical-coherence-domain reflectometry and uses a low-coherence fiber interferometer.
Keywords :
ceramics; fibre optic sensors; flaw detection; light coherence; light interferometry; nondestructive testing; optical images; reflectometry; ceramic materials; low-coherence fiber interferometer; optical gated scatter reflectometer; optical-coherence-domain reflectometry; subsurface defect detection; subsurface region; Ceramics; Light scattering; Mirrors; Optical interferometry; Optical materials; Optical refraction; Optical scattering; Optical sensors; Optical surface waves; Physics;
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2