Title :
Unilateral amplifier S-parameter extraction technique
Author :
Ching, Kendall S. ; Miyamoto, Ryan Y. ; Shiroma, Wayne A.
Author_Institution :
Dept. of Electr. Eng., Hawaii Univ., Honolulu, HI, USA
Abstract :
A technique for extracting the S-parameters of a unilateral device is presented. The proposed method requires five output power measurements, allowing for real-time evaluation of an active device. An overview of the method, along with simulation and measurement data, is presented here.
Keywords :
S-parameters; amplifiers; power measurement; S-parameter extraction technique; active device; output power measurements; unilateral amplifier; Circuits; Data mining; Fabrication; Frequency; Micromechanical devices; Operational amplifiers; Power amplifiers; Power generation; Power measurement; Scattering parameters;
Conference_Titel :
Wireless Communications and Applied Computational Electromagnetics, 2005. IEEE/ACES International Conference on
Print_ISBN :
0-7803-9068-7
DOI :
10.1109/WCACEM.2005.1469703
