Title :
Requirements for noise parameter measurements in superconducting electronic systems
Author :
O´Callaghan, J.M. ; Beyer, J.B.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
General considerations on the measurement of noise parameters in highly mismatched systems are discussed. In particular, the problem of noise characterization of active superconducting microwave devices is addressed. A measurement technique that includes an error analysis is presented along with current data for a superconducting flux flow transistor.<>
Keywords :
electric noise measurement; microwave measurement; solid-state microwave devices; superconducting junction devices; active superconducting microwave devices; error analysis; highly mismatched systems; noise parameter measurements; superconducting electronic systems; superconducting flux flow transistor; Active noise reduction; Admittance; Electric variables measurement; Error analysis; Isolators; Noise figure; Noise measurement; Superconducting device noise; Superconducting devices; Superconducting microwave devices;
Conference_Titel :
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-87942-591-1
DOI :
10.1109/MWSYM.1991.146971
