DocumentCode
3550304
Title
Requirements for noise parameter measurements in superconducting electronic systems
Author
O´Callaghan, J.M. ; Beyer, J.B.
Author_Institution
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear
1991
fDate
10-14 July 1991
Firstpage
237
Abstract
General considerations on the measurement of noise parameters in highly mismatched systems are discussed. In particular, the problem of noise characterization of active superconducting microwave devices is addressed. A measurement technique that includes an error analysis is presented along with current data for a superconducting flux flow transistor.<>
Keywords
electric noise measurement; microwave measurement; solid-state microwave devices; superconducting junction devices; active superconducting microwave devices; error analysis; highly mismatched systems; noise parameter measurements; superconducting electronic systems; superconducting flux flow transistor; Active noise reduction; Admittance; Electric variables measurement; Error analysis; Isolators; Noise figure; Noise measurement; Superconducting device noise; Superconducting devices; Superconducting microwave devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location
Boston, MA, USA
ISSN
0149-645X
Print_ISBN
0-87942-591-1
Type
conf
DOI
10.1109/MWSYM.1991.146971
Filename
146971
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