Title :
Accurate experimental characterization of three-ports
Author :
Goldberg, S.B. ; Steer, M.B. ; Franzon, P.D.
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Abstract :
An accurate procedure is reported for experimentally characterizing microwave devices using two-port measurements. Only reflection measurements are used to determine three-port reflection parameters, and transmission measurements are primarily used to determine three-port transmission parameters, thus considerably reducing the sensitivity of the procedure. No assumptions about the three-port device are made. A comparison with the renormalization method of D. Woods (1977) was made using a microstrip tee, and an improvement in accuracy was confirmed.<>
Keywords :
microwave reflectometry; multiport networks; strip lines; microstrip tee; reflection measurements; renormalization method; sensitivity; three-port reflection parameters; three-port transmission parameters; transmission measurements; two-port measurements; Frequency; Impedance measurement; Laboratories; Microstrip; Microwave devices; Microwave measurements; Q measurement; Reflection; Resonance; Scattering parameters;
Conference_Titel :
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-87942-591-1
DOI :
10.1109/MWSYM.1991.146972
