Title :
Quality distribution and yield theory for diode laser fabrication
Author :
Wu, Yimin A. ; Chang-Hasnain, Connie J.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Abstract :
Summary form only given. The ability to understand predict, and interpret fabrication yield is extremely important for efficient and cost-effective manufacturing. Here, we present a yield theory derived from simple fundamental equations. This theory is compared with a large number of sets of experimental data, including threshold current, voltage, and wavelength distributions of both vertical-cavity surface-emitting lasers (VCSELs) and edge-emitting lasers.
Keywords :
laser cavity resonators; laser theory; optical fabrication; probability; quality control; semiconductor device models; semiconductor lasers; semiconductor technology; surface emitting lasers; cost-effective manufacturing; diode laser fabrication; edge-emitting lasers; fabrication yield; quality distribution; simple fundamental equations; threshold current; vertical-cavity surface-emitting lasers; voltage; wavelength distributions; yield theory; Diode lasers; Equations; Laser theory; Manufacturing; Optical device fabrication; Surface emitting lasers; Surface waves; Threshold current; Threshold voltage; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2
