DocumentCode :
355094
Title :
Multiple exposure interferometric lithography-a novel approach to nanometer structures
Author :
Xiaolan Chen ; Zaidi, Saleem H. ; Brueck, Steven R. J.
Author_Institution :
Center for High Technol. Mater., New Mexico Univ., Albuquerque, NM, USA
fYear :
1996
fDate :
2-7 June 1996
Firstpage :
390
Lastpage :
391
Abstract :
Summary form only given. Trends in both integrated circuit and flat-panel display manufacturing technologies require improvements in nanoscale lithography. In both fields, there is increasing demand for a cost-effective lithographic technique that can produce large fields (to -45 cm diagonal for displays) of nanoscale structures. Imaging optical lithographic techniques are approaching fundamental limits in resolution. Interferometric lithography, in contrast provides a very simple and inexpensive technique that features essentially unlimited depth-of-field patterns with critical dimensions (CD) as small as /spl Lambda//4 over very huge areas.
Keywords :
flat panel displays; image resolution; integrated circuit technology; integrated circuit testing; light interferometry; lithography; nanotechnology; IC testing; cost-effective lithographic technique; critical dimensions; flat-panel display manufacturing technologies; fundamental limits; imaging optical lithographic techniques; integrated circuit manufacturing technologies; interferometric lithography; large fields; multiple exposure interferometric lithography; nanometer structures; nanoscale lithography; nanoscale structures; resolution; unlimited depth-of-field patterns; very huge areas; Conductors; Displays; Interference; Interferometric lithography; Manufacturing; Nanostructures; Optical imaging; Optical interferometry; Optical sensors; Resists;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2
Type :
conf
Filename :
864831
Link To Document :
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