DocumentCode
3550961
Title
Analysis of shielded coplanar waveguide step discontinuity considering the finite metallization thickness effect
Author
Kuo, C.-W. ; Kitazawa, T. ; Itoh, T.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear
1991
fDate
10-14 July 1991
Firstpage
473
Abstract
The mode-matching technique is applied to analyze the shielded coplanar waveguide (CPW) step discontinuity. The effect of the finite thickness of the CPW center strip and ground planes is also considered. Results on the frequency-dependent scattering parameters of the shielded CPW step discontinuity incorporating the finite metallization thickness effect are presented.<>
Keywords
waveguide components; waveguide theory; finite metallization thickness effect; frequency-dependent scattering parameters; ground planes; mode-matching technique; shielded coplanar waveguide; step discontinuity; Circuits; Coplanar waveguides; Electromagnetic waveguides; Finline; Frequency; MMICs; Metallization; Scattering parameters; Strips; Waveguide discontinuities;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location
Boston, MA, USA
ISSN
0149-645X
Print_ISBN
0-87942-591-1
Type
conf
DOI
10.1109/MWSYM.1991.147039
Filename
147039
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