Characterization of microwave integrated circuits using an optical phase-locking and sampling system

Author

Hung, H.-L.A. ; Li, M.G. ; Huang, S.-l.L. ; Lee, C.H.

Author_Institution

COMSAT Lab., Clarksburg, MD, USA

fYear

1991

fDate

10-14 July 1991

Firstpage

507

Abstract

Using an optical technique, phase-locked microwave signals of up to 15 GHz from voltage-controlled oscillators have been achieved. Combining this technique with a photoconductive switch, a novel microwave waveform sampling system that displays the characteristics of oscillators and amplifiers has been demonstrated. The approach has potential applications for optically phase-locked microwave subsystems and monolithic integrated circuit characterizations.<>

Keywords

MMIC; microwave measurement; phase-locked loops; photoconducting devices; semiconductor switches; variable-frequency oscillators; 15 GHz; PLL; SHF; VCO; microwave integrated circuits; microwave waveform sampling system; optical phase-locking; optically phase-locked microwave subsystems; phase-locked microwave signals; photoconductive switch; sampling system; voltage-controlled oscillators; waveform measurement; Displays; Integrated optics; Microwave integrated circuits; Microwave theory and techniques; Optical switches; Photoconductivity; Photonic integrated circuits; Sampling methods; Stimulated emission; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1991., IEEE MTT-S International

Conference_Location

Boston, MA, USA

ISSN

0149-645X

Print_ISBN

0-87942-591-1

Type

conf

DOI

10.1109/MWSYM.1991.147048

Filename

147048