Title :
Longitudinal-mode control in Fabry-Perot lasers by focused ion beam etching
Author :
Kozlowski, D.A. ; Young, J.S. ; England, J.M.C. ; Plumb, R.G.S.
Author_Institution :
Dept. of Eng., Cambridge Univ., UK
Abstract :
Summary form only given. In principle a ´made-to-measure´ spectrum through laser mode sculpturing can be realized without significant increases in threshold current using this novel focused ion beam etching (FIBE) system where control of both position and depth of the etched trench is incorporated with in situ monitoring.
Keywords :
Fabry-Perot resonators; computerised monitoring; focused ion beam technology; laser cavity resonators; laser modes; laser variables measurement; optical fabrication; position control; semiconductor lasers; sputter etching; Fabry-Perot lasers; etched trench depth control; etched trench position control; focused ion beam etching; in situ monitoring; laser mode sculpturing; longitudinal-mode control; threshold current; Electron optics; Etching; Fabry-Perot; Ion beams; Optical control; Optical scattering; Particle beam optics; Semiconductor lasers; Threshold current; Waveguide lasers;
Conference_Titel :
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-443-2
