DocumentCode
3551311
Title
Accurate characterization of cross-over and other junction discontinuities in two-layer microstrip circuits
Author
Hoorfar, A. ; Zheng, J.X. ; Chang, D.C.
Author_Institution
Dept. of Electr. Eng., Villanova Univ., PA, USA
fYear
1991
fDate
10-14 July 1991
Firstpage
619
Abstract
A mixed-potential spatial-domain integral equation approach is used to model the coupling and junction effects when microstrip structures in two different layers of a common substrate are crossing each other. In particular, some canonical four-port and three-port junctions are characterized by applying a Galerkin method with linear basis functions for the currents. Numerical results are presented.<>
Keywords
microwave circuits; strip lines; waveguide couplers; Galerkin method; coupling effects; cross-over; four-port junctions; junction discontinuities; linear basis functions; mixed-potential spatial-domain integral equation; three-port junctions; two-layer microstrip circuits; Boundary conditions; Conductors; Coupling circuits; Fabrication; Green´s function methods; Integral equations; Microstrip antenna arrays; Microstrip antennas; Moment methods; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location
Boston, MA, USA
ISSN
0149-645X
Print_ISBN
0-87942-591-1
Type
conf
DOI
10.1109/MWSYM.1991.147079
Filename
147079
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