DocumentCode :
3551342
Title :
Experimental determination of high-speed GaAs digital circuit interconnect parameters
Author :
Kiziloglu, K. ; Dagli, N. ; Matthaei, G.L. ; Long, S.I.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fYear :
1991
fDate :
10-14 July 1991
Firstpage :
639
Abstract :
Coplanar strips that are representative of on-chip high-speed digital circuit interconnects have been fabricated on GaAs and characterized up to 18 GHz. Strip widths of 4, 6, and 8 mu m with strip spacings of 4 and 8 mu m and conductor thicknesses of 2500 AA and 5000 AA were used in the experiments. Line parameters such as resistance, capacitance, inductance per unit length, and propagation constant were extracted from these measurements. Measurement results confirm the quasi-TEM (transverse electromagnetic) properties of such interconnects.<>
Keywords :
III-V semiconductors; digital circuits; guided electromagnetic wave propagation; strip lines; 18 GHz; 2500 AA; 4 to 8 micron; 5000 AA; GaAs; capacitance; coplanar strips; digital circuit interconnect parameters; inductance; line parameters; on-chip high-speed digital circuit interconnects; propagation constant; quasi-TEM; resistance; strip spacings; strip widths; Capacitance measurement; Conductors; Digital circuits; Electrical resistance measurement; Electromagnetic measurements; Gallium arsenide; Inductance measurement; Integrated circuit interconnections; Propagation constant; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1991., IEEE MTT-S International
Conference_Location :
Boston, MA, USA
ISSN :
0149-645X
Print_ISBN :
0-87942-591-1
Type :
conf
DOI :
10.1109/MWSYM.1991.147084
Filename :
147084
Link To Document :
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