Title :
Methods of detecting contaminants on electron device components
Abstract :
The need for test methods in contaminant studies and control of parts processing is reviewed, with major emphasis on tests which are simple, non-destructive and sensitive.
Keywords :
Electron devices; Electron tubes; Laboratories; Nondestructive testing; Oxidation; Process control; Surface contamination; Telephony; Water pollution; Water storage;
Conference_Titel :
Electron Devices Meeting, 1956 International
DOI :
10.1109/IEDM.1956.186976
