DocumentCode
3551673
Title
An 85-watt dissipation silicon power transistor
Author
Lanzl, R.H. ; Maxwell, D.E. ; Percival, J.O. ; Waldner, Manuela
Volume
3
fYear
1957
fDate
1957
Firstpage
114
Lastpage
114
Abstract
Production prototype silicon transistors have been made using large area diffused base structure. Simultaneous diffusion of gallium and phosphorus is used to form the diffused base structures. The geometry and doping level of the structure can be controlled by varying the impurity source composition and temperature, The phosphorus surface concentration is a much less rapidly varying function of source temperature than is the gallium surface concentration and is determined primarily by the source composition. Two line base contacts and one line emitter contact are attached to the wafer in a one-shot process in which all contacts are made simultaneously. The structure is then encapsulated in a hermetically sealed package. The electrical characteristics of a group of units are given. The transistors are capable of dissipating 85 watts at a 25°C mounting base temperature and have been used, as is described, in circuits to deliver 25 watts in Class A and 80 watts in Class B push-pull operation.
Keywords
Contacts; Doping; Geometry; Hermetic seals; Impurities; Power transistors; Production; Prototypes; Silicon; Temperature control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1957 International
Type
conf
DOI
10.1109/IEDM.1957.187054
Filename
1472325
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