DocumentCode :
3551678
Title :
The preparation of semiconductor devices by lapping and diffusion techniques
Author :
Nelson, H.
Volume :
3
fYear :
1957
fDate :
1957
Firstpage :
114
Lastpage :
114
Abstract :
A new approach to the fabrication of semiconductor devices has been investigated. This approach allows the processing of large semiconductor wafers to a point where they can be diced into numerous and identical devices. Lapping, instead of etching, is employed for all shaping of the units and the high degree of precision built into the lapping apparatus is passed on to all of the devices prepared. The approach is applicable to the fabrication of a great variety of semiconductor devices. Unipolar photounipolar as well as bipolar transistors and negative resistance devices have been fabricated. These devices exhibit superior electrical characteristics. Silicon power transistors have current transfer ratios in the 20-40 range and power gains from 30-40 db. Silicon unipolar transistors have transconductances in the neighborhood of 500 µmhos and input resistances of about 100 megohms, Silicon photounipolar transistors show a dc photo response of 2-20 amperes per lumen.
Keywords :
Bipolar transistors; Electric resistance; Electric variables; Etching; Fabrication; Gain; Lapping; Power transistors; Semiconductor devices; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1957 International
Type :
conf
DOI :
10.1109/IEDM.1957.187059
Filename :
1472330
Link To Document :
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