DocumentCode :
3551772
Title :
A hypersensitive voltage-variable silicon capacitor
Author :
Frazier, H.D.
Author_Institution :
Pacific Semiconductors, Inc., Culver City, California
Volume :
5
fYear :
1959
fDate :
1959
Firstpage :
52
Lastpage :
52
Abstract :
A voltage-variable capacitor, referred to as "hypersensitive" is described where, in the relation C=V-n, hypersensitivity is defined as n >0.5. The capacitors described have n=1. This type of device obtains hypersensitivity by the use of high-gradient, diffused, impurity distributions and very high Q values are possible with the method of fabrication. As is usual with such devices Q values are higest at the lowest capacitance value. These "hypersensitive" capacitors have a range of 10 to 1 or more in capacitance over a range of 10 to 1 in voltage. Q values of these units are greater than 50 at 50 mcps, with maximum capacitance reported from 20µµf to 1000µµf.
Keywords :
Capacitance; Capacitors; Cities and towns; Fabrication; Impurities; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1959 International
Type :
conf
DOI :
10.1109/IEDM.1959.187121
Filename :
1472660
Link To Document :
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