Title : 
Optical output degradation of II-VI blue-green light emitting diodes
         
        
            Author : 
Chuang, Shun L. ; Ukita, M. ; Kijima, Shuji ; Taniguchi, Shinji ; Ishibashi, A.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
         
        
        
        
        
            Abstract : 
Summary form only given. Room-temperature continuous-wave operation of II-VI blue-green laser diodes has been possible with a lifetime exceeding an hour. Some major problems limiting a long life-time for II-VI blue-green lasers are a high pre-existing defect density and the growth of defect density during laser operation. Recently, we proposed a theoretical model with an analytical solution for the degradation mechanism of II-VI LEDs based on the carrier-recombination-enhanced defect generation. In this paper we compare this model with experimental results on a CdZnSe LED.
         
        
            Keywords : 
II-VI semiconductors; cadmium compounds; electron-hole recombination; light emitting diodes; zinc compounds; CdZnSe; II-VI blue-green light emitting diode; carrier-recombination-enhanced defect generation; lifetime; optical output degradation; room-temperature continuous-wave operation; Aging; Degradation; Diode lasers; Equations; Laser modes; Laser theory; Light emitting diodes; Power generation; Radiative recombination; Temperature;
         
        
        
        
            Conference_Titel : 
Lasers and Electro-Optics, 1996. CLEO '96., Summaries of papers presented at the Conference on
         
        
            Conference_Location : 
Anaheim, CA, USA
         
        
            Print_ISBN : 
1-55752-443-2