Title :
A 2500 Ω / □ tantalum thin film resistor for silicon integrated circuits
Author :
Wagner, S.R. ; Walker, M.J.
Author_Institution :
Philco Corp., Lansdale, Pa.
Abstract :
The ability to utilize very high sheet resistivities is one of the advantages of using thin film resistors on silicon integrated circuits. This paper discusses a process which produces a film having a sheet resistivity of 2500 Ω/□. an order of magnitude higher than current typical thin films. Five-megohm resistors have been fabricated on 12 × 20 mil areas. These resistors have TCR´s of -250 to -350 ppm and exhibit elevated temperature aging stability comparable to that reported for tantalum films having much lower resistivities. This stability is obtained without the addition of a further protective coating.
Keywords :
Aging; Coatings; Conductivity; Protection; Resistors; Semiconductor thin films; Silicon; Stability; Temperature; Thin film circuits;
Conference_Titel :
Electron Devices Meeting, 1965 International
Conference_Location :
Washington, DC, USA
DOI :
10.1109/IEDM.1965.187572