• DocumentCode
    3552388
  • Title

    Calculations of cut-off frequency, breakdown voltage and capacitance for diffused junctions in thin epitaxial layers

  • Author

    Lee, T.P.

  • Author_Institution
    Bell Telephone Laboratories, Laureldale, Pa.
  • Volume
    11
  • fYear
    1965
  • fDate
    1965
  • Firstpage
    53
  • Lastpage
    54
  • Abstract
    Recent developments in high quality silicon varactors for low-noise parametric amplifiers and high-efficiency harmonic generators necessitate the use of epitaxial silicon layers that are thinner than 10 microns, with resistivity less than 1 Ω-cm. This paper extends Breitschwerdt´s recent calculations to such thin epitaxial layers and also includes the calculation of series resistance and capacitance per unit area in a range useful for microwave diode design.
  • Keywords
    Capacitance; Conductivity; Cutoff frequency; Diodes; Electrical resistance measurement; Epitaxial layers; Gallium arsenide; Silicon; Telephony; Varactors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1965 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1965.187610
  • Filename
    1474191