DocumentCode
3552388
Title
Calculations of cut-off frequency, breakdown voltage and capacitance for diffused junctions in thin epitaxial layers
Author
Lee, T.P.
Author_Institution
Bell Telephone Laboratories, Laureldale, Pa.
Volume
11
fYear
1965
fDate
1965
Firstpage
53
Lastpage
54
Abstract
Recent developments in high quality silicon varactors for low-noise parametric amplifiers and high-efficiency harmonic generators necessitate the use of epitaxial silicon layers that are thinner than 10 microns, with resistivity less than 1 Ω-cm. This paper extends Breitschwerdt´s recent calculations to such thin epitaxial layers and also includes the calculation of series resistance and capacitance per unit area in a range useful for microwave diode design.
Keywords
Capacitance; Conductivity; Cutoff frequency; Diodes; Electrical resistance measurement; Epitaxial layers; Gallium arsenide; Silicon; Telephony; Varactors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1965 International
Type
conf
DOI
10.1109/IEDM.1965.187610
Filename
1474191
Link To Document