• DocumentCode
    3552509
  • Title

    A process for ceramic dielectric isolation for integrated circuits

  • Author

    Ramsey, Thomas H. ; Smith, Tim

  • Author_Institution
    Texas Instruments, Inc., Dallas, Texas.
  • Volume
    12
  • fYear
    1966
  • fDate
    1966
  • Firstpage
    68
  • Lastpage
    68
  • Abstract
    A process for dielectric isolation has been developed which is capable of providing integrated circuits with operational characteristics similar to those of discrete components. The technique makes use of a backside etch with a ceramic filled isolation medium. Life, thermal and shock tests have indicated no detrimental effects from the isolating cement. A total of 1035 logic block and gated latch devices have been supplied for Redman (NSA) and have given very successful results. The yield based on the present process is about 9% and cost studies have indicated that the Redman type device should cost about $2.66 to manufacture.
  • Keywords
    Ceramics; Circuit testing; Costs; Dielectrics; Electric shock; Etching; Latches; Life testing; Logic devices; Logic gates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1966 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1966.187694
  • Filename
    1474533