DocumentCode :
3552656
Title :
Electron beam accessed silicon diode arrays for image sensing applications
Author :
Labuda, E.F. ; Crowell, M.H.
Author_Institution :
Bell Telephone Laboratory, Murray Hill, N. J.
Volume :
13
fYear :
1967
fDate :
1967
Firstpage :
62
Lastpage :
62
Abstract :
A planar array of reverse biased silicon p-n diodes has been used as the image sensing element in a television camera tube. The optical image is focused onto the n-type substrate which is laterally homogeneous with a thickness typically in the rankle of 0.5 to 1.5 mils while the diode side is scanned by an electron beam, the electron optics being similar to that used in a conventional vidicon. Compared to the evaporated thin film photoconductive type of target used in the vidicon, the silicon diode array target has the following advantages: 1. It does not suffer from electron beam and optical "burn-in." 2. There is no photoconductive lag. 3. A high temperature bake can be used during vacuum processing. 4. It has a broader spectral response and a higher sensitivity.
Keywords :
Cameras; Diodes; Electron beams; Electron optics; Optical films; Optical sensors; Photoconductivity; Planar arrays; Silicon; TV;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1967 International
Type :
conf
DOI :
10.1109/IEDM.1967.187823
Filename :
1474904
Link To Document :
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