• DocumentCode
    3552656
  • Title

    Electron beam accessed silicon diode arrays for image sensing applications

  • Author

    Labuda, E.F. ; Crowell, M.H.

  • Author_Institution
    Bell Telephone Laboratory, Murray Hill, N. J.
  • Volume
    13
  • fYear
    1967
  • fDate
    1967
  • Firstpage
    62
  • Lastpage
    62
  • Abstract
    A planar array of reverse biased silicon p-n diodes has been used as the image sensing element in a television camera tube. The optical image is focused onto the n-type substrate which is laterally homogeneous with a thickness typically in the rankle of 0.5 to 1.5 mils while the diode side is scanned by an electron beam, the electron optics being similar to that used in a conventional vidicon. Compared to the evaporated thin film photoconductive type of target used in the vidicon, the silicon diode array target has the following advantages: 1. It does not suffer from electron beam and optical "burn-in." 2. There is no photoconductive lag. 3. A high temperature bake can be used during vacuum processing. 4. It has a broader spectral response and a higher sensitivity.
  • Keywords
    Cameras; Diodes; Electron beams; Electron optics; Optical films; Optical sensors; Photoconductivity; Planar arrays; Silicon; TV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1967 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1967.187823
  • Filename
    1474904