DocumentCode :
3552668
Title :
Bonding of beam lead integrated circuits
Author :
Howland, F.L. ; Clark, J.E. ; Eleftherion, P.
Author_Institution :
Bell Telephone Laboratories, Allentown, Pa.
Volume :
13
fYear :
1967
fDate :
1967
Firstpage :
76
Lastpage :
76
Abstract :
The development of the sealed-junction, beam-lead silicon integrated circuit permits new freedom in the assembly of complex functional circuits. Because of the intrinsic capabilities of this silicon device technology, handling, registering, and bonding techniques which are capable of achieving high yields at manufacturable rates are being developed. For the device, the beams are utilized as the prime elements for handling and registration of the chip to the pattern of conductors on a substrate. Requirements and procedures for these operations, are briefly described.
Keywords :
Assembly; Bonding forces; Conductors; Copper; Gold; Integrated circuit packaging; Integrated circuit yield; Joining processes; Metallization; Silicon devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1967 International
Type :
conf
DOI :
10.1109/IEDM.1967.187835
Filename :
1474916
Link To Document :
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