Title :
Mobility and 1/f noise of p-channel,
Author :
Takeishi, Y. ; Hara, H. ; Sato, T. ; Takeishi, Yoshinari ; Hara, Hideki ; Sato, Takao
Author_Institution :
Tokyo Shibaura Electric co., Kawasaki, Japan
Keywords :
Absorption; Fabrication; Interface states; Laboratories; Paramagnetic resonance;
Conference_Titel :
Electron Devices Meeting, 1968 International
DOI :
10.1109/IEDM.1968.188069
