Title : 
Silicon gate CMOS integrated circuits
         
        
            Author : 
Burgess, R.R. ; Daniels, R.G.
         
        
            Author_Institution : 
Motorola, Phoenix, Ariz.
         
        
        
        
        
        
        
            Abstract : 
The major advantages offered by silicon-gate CMOS technology have been applied to the fabrication of monolithic integrated circuits for micropower applications. Complementary n- and p-channel enhancement-mode devices fabricated with silicon gate in conjunction with a unique substrate preparation tech, nique have exhibited threshold voltages of 0.5 ± 0.2V. Drain-to-source leakage currents, as well as pot to substrate leakage current, are typically less than 1 nA at 3 V.
         
        
            Keywords : 
CMOS integrated circuits; CMOS technology; Dielectric substrates; Energy consumption; Fabrication; Leakage current; MOS capacitors; Metallization; Silicon; Threshold voltage;
         
        
        
        
            Conference_Titel : 
Electron Devices Meeting, 1970 International
         
        
        
            DOI : 
10.1109/IEDM.1970.188300