DocumentCode
3553287
Title
Ion implantation for junction field effect transistors compatible with integrated circuits
Author
Gardner, K.R. ; Mac Rae, A.U.
Volume
16
fYear
1970
fDate
1970
Firstpage
144
Lastpage
144
Abstract
The ability to use junction field effect transistors in integrated circuits simplifies circuit design. This paper describes the techniques used in fabricating p-channel junction field effect transistors (J-FET) in an integrated circuit, using ion implantation and standard IC processing. This circuit contains resistors, transistors and three J-FETs on the same chip. The J-FETs are used as constant current sources and have a pinch-off voltage of less than 2 volts and an IDSS of ∼ 1 ma. The J-FETs are formed by ion implanting 5 × 1012/cm2B+at 100 keV, using SiO2 as a mask to define the p-region which eventually becomes the channel region. The n-type gate is formed at the same time as the emitters of the transistors. The resultant circuits are characterized by a uniform J-FET pinch-off voltage and IDSS , reflecting the control associated with ion implantation.
Keywords
Circuit synthesis; FET integrated circuits; Ion implantation; Resistors; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1970 International
Type
conf
DOI
10.1109/IEDM.1970.188331
Filename
1476443
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