Title :
Surface charge transistor imaging array
Author :
Engeler, W.E. ; Tiemann, J.J. ; Baertsch, R.D.
Author_Institution :
General Electric Co., Schenectady, N. Y.
Abstract :
Surface-charge transport offers the possibility of achieving both high sensitivity and high image cell density while requiring only a small number of connections to the imaging array itself. The high sensitivity is achieved by allowing the charge-storage reservoirs to integrate the image for an appropriate time which is long compared to the time required for read out. High sensitivity is maintained if part of the array can be read out at the same time that the remainder of the array is integrating the optical image.
Keywords :
Charge transfer; Degradation; Image sensors; Insulation; Integrated optics; Optical arrays; Optical imaging; Optical sensors; Signal to noise ratio; Testing;
Conference_Titel :
Electron Devices Meeting, 1971 International
DOI :
10.1109/IEDM.1971.188396