DocumentCode :
3553355
Title :
Surface charge transistor imaging array
Author :
Engeler, W.E. ; Tiemann, J.J. ; Baertsch, R.D.
Author_Institution :
General Electric Co., Schenectady, N. Y.
Volume :
17
fYear :
1971
fDate :
1971
Firstpage :
74
Lastpage :
74
Abstract :
Surface-charge transport offers the possibility of achieving both high sensitivity and high image cell density while requiring only a small number of connections to the imaging array itself. The high sensitivity is achieved by allowing the charge-storage reservoirs to integrate the image for an appropriate time which is long compared to the time required for read out. High sensitivity is maintained if part of the array can be read out at the same time that the remainder of the array is integrating the optical image.
Keywords :
Charge transfer; Degradation; Image sensors; Insulation; Integrated optics; Optical arrays; Optical imaging; Optical sensors; Signal to noise ratio; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1971 International
Type :
conf
DOI :
10.1109/IEDM.1971.188396
Filename :
1476734
Link To Document :
بازگشت