DocumentCode
3553381
Title
Super-integrated bipolar memory device for high-density, low-power storage
Author
Wiedmann, S.K. ; Berger, H.H.
Author_Institution
IBM Laboratory, Boeblingen, Germany
Volume
17
fYear
1971
fDate
1971
Firstpage
104
Lastpage
104
Abstract
A novel bipolar memory device for high-density, low power read/write storages has been developed, fabricated and analyzed. It has been operated at a standby power of 100 nanowatts and can be conveniently switched to currents larger by orders of magnitude to speed up the read and write operation. The cell size of 4 mil2achieved by conventional processing with a 3µ epitaxial layer thickness and a minimum metal line width of 0.25 mils (spacing 0.15 mil) allows at least 2000 bits/chip. Despite this high density an access/cycle time of about 60/150ns has been projected from array simulation measurements on single devices. In contrast to other approaches in this bit density range, this statically stable device does not require any refresh operation.
Keywords
Acceleration; Electrodes; Electron traps; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1971 International
Type
conf
DOI
10.1109/IEDM.1971.188421
Filename
1476759
Link To Document