• DocumentCode
    3553406
  • Title

    Buried layer ion implanted resistors

  • Author

    Seidel, Thomas E. ; Gibson, W.C.

  • Volume
    17
  • fYear
    1971
  • fDate
    1971
  • Firstpage
    132
  • Lastpage
    134
  • Abstract
    Meg-Ohm silicon monolithic resistors have been fabricated with sheet resistance up to 120k Ω/□ using an implanted p-layer resistor which is buried under an implanted n-guard layer. The n-guard layer protects against slice to slice variations of the fixed surface charge and was made using phosphorus doses and energy of 1.5-5 × 1012P/cm2and 30 keV. Resistors have been fabricated up to 20 MΩ(and sheet resistances in the range of 7-120k Ω) using boron doses and energies of 1-3 × 1012B/cm2and 30-300 keV. The sheet resistance, voltage dependence of resistance, temperature coefficients, junction leakage and parasitic capacitance have been measured for different cases.
  • Keywords
    Boron; Capacitance measurement; Electrical resistance measurement; Parasitic capacitance; Protection; Resistors; Silicon; Surface resistance; Temperature dependence; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1971 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1971.188443
  • Filename
    1476781