DocumentCode
3553406
Title
Buried layer ion implanted resistors
Author
Seidel, Thomas E. ; Gibson, W.C.
Volume
17
fYear
1971
fDate
1971
Firstpage
132
Lastpage
134
Abstract
Meg-Ohm silicon monolithic resistors have been fabricated with sheet resistance up to 120k Ω/□ using an implanted p-layer resistor which is buried under an implanted n-guard layer. The n-guard layer protects against slice to slice variations of the fixed surface charge and was made using phosphorus doses and energy of 1.5-5 × 1012P/cm2and 30 keV. Resistors have been fabricated up to 20 MΩ (and sheet resistances in the range of 7-120k Ω) using boron doses and energies of 1-3 × 1012B/cm2and 30-300 keV. The sheet resistance, voltage dependence of resistance, temperature coefficients, junction leakage and parasitic capacitance have been measured for different cases.
Keywords
Boron; Capacitance measurement; Electrical resistance measurement; Parasitic capacitance; Protection; Resistors; Silicon; Surface resistance; Temperature dependence; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1971 International
Type
conf
DOI
10.1109/IEDM.1971.188443
Filename
1476781
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