• DocumentCode
    3553418
  • Title

    Characteristics of single heterojunction GaAlAs close-confinement lasers from 250 ° K to 400 ° K

  • Author

    Gill, R.B. ; Gonda, T. ; Speers, R.R.

  • Author_Institution
    RCA Solid State Division, Somerville, N. J.
  • fYear
    1971
  • fDate
    11-13 Oct. 1971
  • Firstpage
    142
  • Lastpage
    142
  • Abstract
    The performance characteristics of GaAlAs laser diodes which emit in the wavelength interval from 7500 Å to 8000 Å at 300°K will be discussed. Two basic devices are considered: Single-Pellet devices having emission widths ranging from 3 to 16 mils and multiple-pellet stacked arrays. The devices were fabricated from GaAlAs heterojunction epitaxial layers which were grown on GaAs single crystal substrate by multiple liquid phase epitaxy. Data is presented showing emission wavelength, wavelength half-width, quantum efficiency, peak power output, lasing threshold current density and power efficiency of these devices in the temperature range of 250°K to 400°K. The performance and reliability of the GaAlAs lasers is then compared to single heterojunction GaAs lasers of the same geometry.
  • Keywords
    Diode lasers; Epitaxial growth; Epitaxial layers; Gallium arsenide; Heterojunctions; Liquid crystal devices; Semiconductor laser arrays; Substrates; Temperature distribution; Threshold current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1971 International
  • Conference_Location
    Washington, DC, USA
  • Type

    conf

  • DOI
    10.1109/IEDM.1971.188454
  • Filename
    1476792