DocumentCode
3553418
Title
Characteristics of single heterojunction GaAlAs close-confinement lasers from 250 ° K to 400 ° K
Author
Gill, R.B. ; Gonda, T. ; Speers, R.R.
Author_Institution
RCA Solid State Division, Somerville, N. J.
fYear
1971
fDate
11-13 Oct. 1971
Firstpage
142
Lastpage
142
Abstract
The performance characteristics of GaAlAs laser diodes which emit in the wavelength interval from 7500 Å to 8000 Å at 300°K will be discussed. Two basic devices are considered: Single-Pellet devices having emission widths ranging from 3 to 16 mils and multiple-pellet stacked arrays. The devices were fabricated from GaAlAs heterojunction epitaxial layers which were grown on GaAs single crystal substrate by multiple liquid phase epitaxy. Data is presented showing emission wavelength, wavelength half-width, quantum efficiency, peak power output, lasing threshold current density and power efficiency of these devices in the temperature range of 250°K to 400°K. The performance and reliability of the GaAlAs lasers is then compared to single heterojunction GaAs lasers of the same geometry.
Keywords
Diode lasers; Epitaxial growth; Epitaxial layers; Gallium arsenide; Heterojunctions; Liquid crystal devices; Semiconductor laser arrays; Substrates; Temperature distribution; Threshold current;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1971 International
Conference_Location
Washington, DC, USA
Type
conf
DOI
10.1109/IEDM.1971.188454
Filename
1476792
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