Title :
Fault analysis of differential cascode voltage switch circuits
Author :
Wu, D. ; Davis, J. ; Swanson, B.
Author_Institution :
IBM VLSI Silicon, Boca Raton, FL, USA
Abstract :
It is shown that the manufacturing process defects of DCVS (differential cascode voltage switch) circuits can be modeled as conventional stuck-at faults. A one-to-one correspondence relationship between each defect and each stuck-at fault is depicted using failure analysis. The results also show that a DCVS circuit can be fully tested using the fault model developed here
Keywords :
CMOS integrated circuits; electrical faults; failure analysis; integrated logic circuits; CMOS logic circuits; DCVS circuit; differential cascode voltage switch; failure analysis; fault analysis; fault model; manufacturing process defects; stuck-at faults; CMOS technology; Circuit faults; Circuit noise; Logic circuits; Logic devices; Silicon; Switches; Switching circuits; Very large scale integration; Voltage;
Conference_Titel :
Southeastcon '91., IEEE Proceedings of
Conference_Location :
Williamsburg, VA
Print_ISBN :
0-7803-0033-5
DOI :
10.1109/SECON.1991.147694
